标题 |
Depth‐of‐Discharge Dependent Capacity Decay Induced by the Accumulation of Oxidized Lattice Oxygen in Li‐Rich Layered Oxide Cathode
富锂层状氧化物阴极中氧化晶格氧积累引起的放电深度相关容量衰减
|
网址 | |
DOI | |
其它 |
期刊:Angewandte Chemie International Edition 作者:Kang Zhang; Yilong Chen; Yuanlong Zhu; Qizheng Zheng; Yonglin Tang; et al 出版日期:2024 |
求助人 | |
下载 |