标题 |
专利、报告等 Eliminating spacer-induced degradations in LDD transistors
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DOI |
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其它 |
T. Y. Huang, M. Koyanagi, A. G. Lewis, R. A. Martin, and J. Y. Chen, “Eliminating spacer-induced degradations in LDD transistors,” in Proc. I987 Znt. Symp. VLSZ Technology, System, and Application (Taipei), p. 260. |
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下载 |
compell2022 求助人 Lv1 发起了本次求助