极化子
材料科学
声子
凝聚态物理
带隙
密度泛函理论
光电发射光谱学
电子
价(化学)
电子结构
金红石
电荷密度
化学物理
X射线光电子能谱
光电子学
化学
物理
计算化学
核磁共振
有机化学
量子力学
作者
Miaomiao Xiang,Xiaochuan Ma,Chang Gao,Ziyang Guo,Chenxi Huang,Yue Xing,Shijing Tan,Jin Zhao,Bing Wang,Xiang Shao
标识
DOI:10.1021/acs.jpclett.2c03856
摘要
Interfacial polarons determine the distribution of free charges at the interface and thus play important roles in manipulating the physicochemical properties of hybridized polaronic materials. In this work, we investigated the electronic structures at the atomically flat interface of the single-layer MoS2 (SL-MoS2) on the rutile TiO2 surface using high-resolution angle-resolved photoemission spectroscopy. Our experiments directly visualized both the valence band maximum and the conduction band minimum (CBM) of SL-MoS2 at the K point, which clearly defines a direct bandgap of ∼2.0 eV. Detailed analyses corroborated by density functional theory calculations demonstrated that the CBM of MoS2 is formed by the trapped electrons at the MoS2/TiO2 interface that couple with the longitudinal optical phonons in the TiO2 substrate through an interfacial Fröhlich polaron state. Such an interfacial coupling effect may register a new route for tuning the free charges in the hybridized systems of two-dimensional materials and functional metal oxides.
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