强度(物理)
光强度
环境科学
光学
计算机科学
物理
作者
Zhenmin Zhu,Junxiang Liu,Tai Zhu,Sheng Wang,Chengzhong Wu
出处
期刊:Measurement
[Elsevier]
日期:2024-03-26
卷期号:231: 114536-114536
标识
DOI:10.1016/j.measurement.2024.114536
摘要
During the measurement of structured light, different types of ambient light may cause some interference with the imaging process of grating projection. Therefore, this paper provides a descriptive method of the intensity of ambient light based on the polarization information. This method describes the degree of influence of ambient light on the grating projection system with the Mueller matrix of the target object and then processes the grating image in the frequency domain to reduce the influence of ambient light on the grating projection system. The final experimental results indicate the correctness of the proposed method.
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