表征(材料科学)
纳米尺度
拉曼光谱
纳米技术
材料科学
物理
光学
作者
Yi‐Fan Bao,Mengyuan Zhu,Xiaojiao Zhao,Hongxuan Chen,Xiang Wang,Bin Ren
摘要
This review presents a detailed discussion on the recent theoretical understanding and technical improvements of tip-enhanced Raman spectroscopy (TERS), and summarizes recent advances of TERS in studying materials and interfaces.
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