图层(电子)
理论(学习稳定性)
材料科学
分解水
光电子学
工程物理
计算机科学
纳米技术
化学
物理
机器学习
生物化学
光催化
催化作用
作者
Yingying Wang,Yuxuan Chen,Yifei Yun,Xiana Hong,Yongchao Huang,Hongbing Ji
标识
DOI:10.1016/j.apcatb.2024.124375
摘要
Engineering the hole transfer layer is a promising approach to suppress the bulk charge recombination of photoanodes for enhancing solar water splitting performance. Herein, functional cobalt-molybdenum bimetallic phosphide (CoMoP) layer are inserted between bismuth vanadate (BiVO4) and NiFeOx oxygen evolution cocatalyst (OEC) as hole transfer layer to construct an integrated photoanode (NiFeOx/CoMoP/BiVO4). This state-of-the-art NiFeOx/CoMoP/BiVO4 photoanode not only achieves a superior photocurrent density of 5.82 mA/cm2 at 1.23 V vs a reversible hydrogen electrode (vs RHE), but also an outstanding 60 h long-term photostability (100 mW/cm2). Such excellent PEC performance can be attributed to the engineering CoMoP hole layer in NiFeOx/BiVO4, promoting hole transfer, retarding bulk charge recombination and accelerating the surface water oxidation kinetics. This study contributes to the role of the hole transfer layer and sheds light on the development of effective and stable photoanodes for PEC water splitting.
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