MURA is an inevitable topic in AMOLED technology and remains central to research aimed at enhancing image quality and yield rates. The de‐mura algorithm, implemented via DDIC, stands out as the most cost‐effective and efficient solution among various approaches. However, due to its complexity, assessing the extent of AMOLED MURA and the efficacy of the de‐mura algorithm has predominantly relied on expert visual judgment, complicating the application of a quantifiable method for swift determination in both algorithm development and production stages. This paper proposes a method for the quantitative evaluation of MURA severity and de‐mura algorithm performance. Initially, high‐definition camera images capture and sample the panel's raw data. Subsequently, this data undergoes processing with visual image generation technology to create a target value delta table, representing MURA across different dimensions, as illustrated in Figure 1. Lastly, the paper introduces a fast, adaptive quantization evaluation approach, conducting targeted demonstrations that align with actual data on brightness and color uniformity, high‐frequency MURA, and edge MURA.