电阻随机存取存储器
材料科学
氧化物
非易失性存储器
数据保留
缩放比例
纳米技术
光电子学
工程物理
电气工程
冶金
工程类
几何学
数学
电压
作者
H.-S. Philip Wong,Heng-Yuan Lee,Shimeng Yu,Yu-Sheng Chen,Yi Wu,Pang-Shiu Chen,Byoungil Lee,Frederick T. Chen,Ming‐Jinn Tsai
出处
期刊:Proceedings of the IEEE
[Institute of Electrical and Electronics Engineers]
日期:2012-05-25
卷期号:100 (6): 1951-1970
被引量:2434
标识
DOI:10.1109/jproc.2012.2190369
摘要
In this paper, recent progress of binary metal–oxide resistive switching random access memory (RRAM) is reviewed. The physical mechanism, material properties, and electrical characteristics of a variety of binary metal–oxide RRAM are discussed, with a focus on the use of RRAM for nonvolatile memory application. A review of recent development of large-scale RRAM arrays is given. Issues such as uniformity, endurance, retention, multibit operation, and scaling trends are discussed.
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