单晶硅
材料科学
磨料
钻石
脆性
薄脆饼
磨料加工
线速
碳化硅
机械加工
硅
复合材料
缩进
冶金
机械工程
纳米技术
工程类
作者
Yu Gao,Pei Qi Ge,Zhi Jian Hou
出处
期刊:Key Engineering Materials
日期:2007-11-01
卷期号:359-360: 450-454
被引量:17
标识
DOI:10.4028/www.scientific.net/kem.359-360.450
摘要
The physical model of fixed-abrasive diamond wire-sawing monocrystalline silicon was founded to analyze the elastic deformation of the wire, supposing that every grit was connected to the surface of the wire by a spring. Ignoring lateral vibration of the wire, the geometrical model of wire-sawing was founded; the average cut depth of single grit was calculated theoretically. Based the indentation fracture mechanics and investigations on brittle-ductile transition of machining monocrystalline silicon, the removal mechanism and surface formation was studied theoretically. It shows that in the case of wire-sawing velocity of 10m/s or higher, infeed velocity of 0.20mm/s and diamond grain size of 64μm or smaller, the chip formation and material removal is in a brittle regime mainly, but the silicon wafer surface formation is sawed in a ductile regime. The size of the abrasives, the wire-saw velocity and infeed velocity can influence the sawing process obviously.
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