ToF-SIMS depth profile of the surface film on pure magnesium formed by immersion in pure water and the identification of magnesium hydride

Time of Flight-Secondary Ion Mass Spectrometry (ToF-SIMS) was used to examine the film formed on pure magnesium by immersion for 2 min in ultra pure water. The ToF-SIMS data indicates that there is magnesium hydride within the surface film. The presence of MgH2 is a result of the Mg corrosion mechanism.