显微镜
扫描电镜
超分辨显微术
光学显微镜
光激活定位显微镜
衍射
光学
分辨率(逻辑)
薄层荧光显微镜
光学(聚焦)
显微镜
材料科学
计算机科学
物理
激光器
扫描共焦电子显微镜
人工智能
受激发射
扫描电子显微镜
作者
Bi‐Chang Chen,George Komis,Christelle Rosazza
出处
期刊:Science
[American Association for the Advancement of Science]
日期:2016-11-24
卷期号:354 (6315): 1055-1055
标识
DOI:10.1126/science.354.6315.1055-b
摘要
The diffraction limit for light microscopy (approximately half the wavelength of light used to image a sample) was for many years a barrier to truly high-resolution microscopy. Superresolution microscopy came about through the recognition that clever hardware design and digital image processing could break through the diffraction limit, enabling scientists to image down to the molecular level. Of all the superresolution techniques, structured illumination microscopy (SIM) is probably the most relevant for live samples, primarily because it is the most versatile and suitable for fairly long exposures and dynamic cell imaging. Stimulated emission depletion microscopy (STED), photoactivated localization microscopy (PALM), and stochastic optical reconstruction microscopy (STORM), as well as techniques derived from them, provide higher-resolution images but tend to require considerably more laser power than SIM—making phototoxicity a significant problem. This webinar will provide a summary of superresolution microscopy, with a particular focus on SIM, and will highlight the important factors to consider when undertaking microscopy experiments, including hardware, software, and samples.
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