Optical Characterization of Dynamic CMUTs Using Zygo Optical Profilometers: An Alternative to Laser Doppler Vibrometers
轮廓仪
光学
干涉测量
材料科学
超声波传感器
多普勒效应
声学
物理
表面光洁度
天文
复合材料
作者
Ahmad Elshenety,Meltem Erdem,Mehmet Yılmaz
出处
期刊:Journal of microelectromechanical systems [Institute of Electrical and Electronics Engineers] 日期:2025-01-01卷期号:: 1-6
标识
DOI:10.1109/jmems.2024.3524004
摘要
Laser Doppler Vibrometers (LDVs) are the most common optical characterization equipment for CMUTs since LDVs characterize both static and dynamic CMUTs in terms of static deflection and resonance frequency, respectively. However, LDVs are not always available for the researchers of ultrasonic transducers. Zygo optical profilometer is also used as an optical characterization equipment for CMUTs but only for static CMUTs. In this study, we show that Zygo optical profilometers could be used to characterize dynamic CMUTs as well. The study shows that Zygo optical profilometers could be an alternative to LDVs performing both static and dynamic analyses of CMUTs. A circular CMUT cell fabricated by wafer bonding technique is characterized using Zygo optical profilometer. The first three resonance frequencies obtained by Zygo optical profilometer match the resonance frequencies obtained by impedance analyzer and ANSYS modal analysis. The equipment could also be used to characterize other ultrasonic transducers such as PMUTs and piezoelectric transducers.2024-0171