卤化物
化学物理
离子阱
离子
离子键合
光致发光
存水弯(水管)
材料科学
纳米技术
化学
无机化学
物理
光电子学
有机化学
气象学
作者
Xinli Wang,Ziyue Jiao,Haohui Fang,Jun Zhan,Dandan Cao,Xiao Huang,Yi Wang,Xi‐Cheng Ai,Jianping Zhang
出处
期刊:Nano Letters
[American Chemical Society]
日期:2024-12-12
被引量:2
标识
DOI:10.1021/acs.nanolett.4c05700
摘要
Trap state engineering has been widely employed to manipulate the dynamics of ion migration in metal halide perovskites (MHPs), a crucial factor associated with the performance and stability of MHP-based devices. However, the specific roles of different trap states remain poorly understood due to their complicated spatial and energetics distributions. Herein, we propose a methodology for independently regulating the distributions of bulk shallow and surface deep trap states in MHPs. By combining in situ photoluminescence spectroscopy with wide-field imaging microscopy, we elucidate the effect of surface trap states on promoting long-range interparticle ion migration. Interestingly, we ascertain with time-resolved photoelectric techniques that the majority of mobile ionic defects involved in ion migration are predominantly contributed by bulk trap states. Our findings suggest that targeted manipulation of bulk shallow and surface deep trap states can be effective in reducing the number of mobile ions and decelerating the rate of ion migration, respectively.
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