化学机械平面化
抛光
材料科学
表面粗糙度
溶解
表面光洁度
Crystal(编程语言)
复合材料
化学工程
计算机科学
工程类
程序设计语言
作者
Ziyuan Liu,Hang Gao,Zhipeng Cheng,Xuanping Wang
标识
DOI:10.1080/10426914.2024.2437750
摘要
This paper proposes a reverse growth surface planarization mechanism for achieving high-efficiency precision processing of the potassium dihydrogen phosphate (KDP) crystal. The KDP crystal reverse growth has ordered and controllable characteristics similar to growth, which differs from the disordered and random dissolution in the natural state. Experiments are conducted using a high-precision annular polisher to investigate the surface characteristics, material removal, and surface planarization of different crystallographic planes in reverse growth. The repeat utilization of polishing liquids is studied to reduce processing costs. The difference in material removal and surface roughness of different crystallographic planes obtained from the same reverse growth polishing process is within 8%. The suitable undersaturation range for reverse growth surface planarization is 0.01–0.18, with a maximum material removal rate of 90 μm/min, 50 times that of the microemulsion polishing methods. Finally, a mirror-like KDP crystal surface is obtained with a surface roughness Ra of 0.00975 μm.
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