Effect of temperature on the low cycle fatigue properties of BGA solder joints

材料科学 焊接 球栅阵列 冶金 金属间化合物 锡膏 复合材料 合金
作者
Xin Wei,Ali Alahmer,Heneen Ali,Sufyan Tahat,Palash Pranav Vyas,Sa’d Hamasha
出处
期刊:Microelectronics Reliability [Elsevier BV]
卷期号:146: 115031-115031 被引量:15
标识
DOI:10.1016/j.microrel.2023.115031
摘要

Since the restriction of hazardous substances (RoHS) directive, lead-free soldering has been widely broad adopted. In many applications, lead-free alloys have been substituted for conventional SnPb (Tin-Lead) solder. Among lead-free alloys, SAC305(Sn-3.0Ag-0.5Cu) has gained the highest acceptance as a solder alloy. The fatigue performance of solder joints has become an essential reliability assessment criterion due to the transition to more reliable lead-free alloys from highly predictable lead-based alloys. This study examines the shear fatigue characteristics of sandwich test vehicles for SnPb and SAC305 at different temperatures using both Organic Solderability Preservative (OSP) and Electroless Nickel-Immersion Silver (ENIG) surface finishes. The fatigue experiments were performed using an Instron micromechanical tester at a constant strain rate, and microstructural analysis was carried out using Scanning Electron Microscopy (SEM) to identify the Intermetallic Compound (IMC) morphology and failure mode. The stress-strain (hysteresis) loops of SnPb and SAC305 were measured, and the fatigue life of the specimens was estimated using the strain-life equation at various temperatures. SAC305 was observed to have a better fatigue life than SnPb, particularly at higher strain levels or testing temperatures. The OSP surface finish demonstrated superior fatigue properties compared to the ENIG surface finish. Additionally, elevated testing temperatures were found to accelerate fatigue failure in solder joints. The Arrhenius model was utilized to develop a general empirical model that predicts the fatigue life of SAC305 and SnPb solder alloys with OSP and ENIG surface finishes as a function of the strain level and testing temperature.
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