薄脆饼
材料科学
图层(电子)
电镀(地质)
化学机械平面化
镀铜
湿法清洗
洗涤器
冶金
湿式洗涤器
电镀
纳米技术
废物管理
化学
工程类
有机化学
地球物理学
地质学
作者
Fuping Chen,Xiaoyan Zhang,Xi Wang,Zhaowei Jia,Yinuo Jin
标识
DOI:10.1007/978-981-99-2836-1_69
摘要
With semiconductor manufacturing development, it is necessary to perform a damage-free process to remove particles, native oxide layer, metal contamination, organic, sacrificial layer, and other residuals from the wafer surface. For the metal line interconnect, the copper metal layer is deposited by electrochemical plating on the seed layer. The metal layer and the oxide layer need to be planarized by chemical-mechanical polish. All these processes could be summarized as the wet process, which is based on liquid state deionized Water (DIW) or chemistries with some physical auxiliary mechanism to react on the wafer surface. This chapter presents an overview for semiconductor industry wet process tools, processes, and applications, including the following: single-wafer-type scrubber, single-wafer wet etch, single-bath wafer cleaner, cryogenic-aerosol wafer cleaner, chemical mechanical polisher, stress-free polish equipment, and copper electrochemical plating equipment.
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