原子探针
氢
材料科学
纳米
原子单位
氢原子
表征(材料科学)
比例(比率)
断层摄影术
纳米技术
分析化学(期刊)
化学
物理
光学
复合材料
透射电子显微镜
有机化学
量子力学
烷基
色谱法
作者
Yi‐Sheng Chen,Pang-Yu Liu,Ranming Niu,Arun Devaraj,Hung‐Wei Yen,R.K.W. Marceau,Julie M. Cairney
标识
DOI:10.1093/micmic/ozac005
摘要
Abstract Atom probe tomography (APT) is an emerging microscopy technique that has high sensitivity for hydrogen with sub-nanometre-scale spatial resolution, which makes it a unique method to investigate the atomic-scale distribution of hydrogen at interfaces and defects in materials. This article introduces the basics of APT-based hydrogen analysis, particularly the challenge of distinguishing a hydrogen background signal in APT by using hydrogen isotopes, along with strategies to yield high-quality analysis. This article also reviews several important findings on hydrogen distribution in a range of materials, including both structural alloys and functional materials, enabled by using APT. Limitations and future opportunities for hydrogen analysis by APT are also discussed.
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