材料科学
钻石
溅射
图层(电子)
光电子学
蚀刻(微加工)
无定形固体
基质(水族馆)
溅射沉积
纳米技术
复合材料
薄膜
结晶学
化学
海洋学
地质学
作者
Takashi Matsumae,Yuichi Kurashima,Hideki Takagi,Yusuke Shirayanagi,Shuichi Hiza,Kunihiko Nishimura,Eiji Higurashi
标识
DOI:10.1016/j.scriptamat.2022.114725
摘要
GaN and diamond substrates were bonded at room temperature with an atomically thin bonding layer. This entailed sputter etching the surface of the GaN substrate in the bonding machine to expose the active nascent GaN surface. At the same time, rather than using sputter etching, a ∼1 nm-thick Si nano-adhesion layer was deposited on the diamond surface. The advantage of this newly developed approach is that it suppresses the physical damage typically inflicted upon the diamond crystals by sputtering. This restricts the thickness of the amorphous layer at the GaN/diamond bonding interface to less than 2 nm. The proposed GaN/diamond integration is expected to contribute to efficient heat dissipation and facilitate the high-power and high-frequency operation of GaN devices.
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