石墨烯
X射线光电子能谱
材料科学
化学气相沉积
带隙
单层
物理气相沉积
石墨烯纳米带
纳米技术
薄膜
化学工程
光电子学
工程类
作者
J. A. Kelber,Sneha Gaddam,Chiranjeevi Vamala,S. Eswaran,P. A. Dowben
摘要
Graphene can be grown directly on MgO(111) by industrially practical and scalable methods: free radical-assisted chemical vapor deposition (CVD), and physical vapor deposition (PVD). Single layer and double layer films can be produced by PVD, with a ~ 2 monolayer (ML) thick film as the apparent limiting thickness. C(1s) x-ray photoemission spectra (XPS) indicate that in both layers, carbon atoms are in two different oxidation states. Low energy electron diffraction (LEED) data are consistent with this, showing unequal graphene A site/B site intensities for both single and double layer graphene, yielding C3V symmetry. This lifts the A site/B site chemical equivalence in the graphene lattice, and therefore also the HOMO/LUMO degeneracy at the Dirac point. Consistent with this, a band gap of ~ 0.5 -1 eV has been observed for the two layer film. The XPS, LEED and band gap findings indicate that the graphene/MgO interface is commensurate, and that the MgO surface layer is reconstructed, resulting in carbon→MgO charge transfer. In addition, graphene growth by PVD is self-limiting at 2 monolayers thickness. These findings have implications for graphene growth on other (111) oxide surfaces. The ability to grow MgO(111) films on Si(100)-reported in the literature- points to a direct path to the development of graphene-based field effect transistors (FETs) and spin-FETs on MgO(111)/Si(100).
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