铁电性
压电响应力显微镜
薄膜
光电子学
凝聚态物理
开尔文探针力显微镜
化学物理
电介质
电场
作者
Peng Gao,Heng Jui Liu,Yen Lin Huang,Ying-Hao Chu,Ryo Ishikawa,Bin Feng,Ying Jiang,Naoya Shibata,Enge Wang,Yuichi Ikuhara
摘要
Miniature of electronic devices is attractive yet challenging due to structural variation at nanoscale. Here, Gao et al. report atomic imaging of reconstruction and unusual domain walls on Pb(Zr0.2Ti0.8)O3 surfaces, providing possibilities to engineer nanoscale structural change.
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