Crystal structure, electronic band structure, electrical resistivity and scanning probe microscopy studies of layered compound MoOCl2

The structure of MoOCl{sub 2} was determined by single crystal X-ray diffraction, and the electronic structure of MoOCl{sub 2} was calculated by the extended Huckel tight binding method. The electrical resistivity and magneto-resistivity measurements of MoOCl{sub 2} were performed, and the surfaces of MoOCl{sub 2} samples were characterized by scanning tunneling microscopy (STM) and atomic force microscopy (AFM). MoOCl{sub 2} has stacking faults in crystal structure and is a metal. The STM and AFM images of MoOCl{sub 2} differ substantially in brightness pattern. (authors). 13 refs., 6 figs., 2 tabs.