锑
X射线光电子能谱
螺旋钻
氧化锑
金属
俄歇电子能谱
分析化学(期刊)
氧气
化学
材料科学
无机化学
冶金
氧化物
化学工程
环境化学
原子物理学
物理
核物理学
有机化学
工程类
标识
DOI:10.1002/sia.740020502
摘要
Abstract XPS and AES have been applied to the surface analysis of antimony oxides, Sb 2 O 3 , Sb 2 O 4 and Sb 2 O 5 . By means of the computer‐operated separation of oxygen and antimony contribution, the oxygen to metal atomic ratios calculated from XPS data were found to be close to the expected values. An antimony powder sample was found to be covered by a surface layer of Sb 2 O 4 and the variations in shape of Auger MNN peaks of Sb during depth profiling are shown and discussed.
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