纹影
灵敏度(控制系统)
光学
计算机科学
物理
电子工程
工程类
出处
期刊:Optical Engineering
[SPIE - International Society for Optical Engineering]
日期:1968-03-02
卷期号:6 (3)
被引量:15
摘要
The sensitivity of three color schlieren methods currently used is limited because of diffraction inherently associated with them. A new method has been developed that has the same resolution capabilities as the commonly used black and white schlieren technique. At the same time the new method has sensitivity capabilities approaching that of the black and white technique. The paper illustrates both old and new methods and has photographs to compare sensitivity and resolution capabilities of each.
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