薄膜
材料科学
电阻率和电导率
微晶
折射率
分析化学(期刊)
光电导性
相(物质)
带隙
霍尔效应
晶界
活化能
基质(水族馆)
化学
微观结构
复合材料
光电子学
纳米技术
物理化学
冶金
海洋学
有机化学
色谱法
地质学
电气工程
工程类
作者
C. Julien,M. Eddrief,K. Kambas,M. Bałkanski
标识
DOI:10.1016/0040-6090(86)90191-4
摘要
In2Se3 thin films were grown with good stoichiometry at a substrate temperature around 460 K in the α phase and were shown to remain in the β phase above 480 K. The Hall coefficient and the d.c. conductivity of polycrystalline In2Se3 films grown on Pyrex and mica substrates were studied in the temperature range 77–530 K. After thermal treatment above 473 K of the α phase thin film, the electrical resistivity decreased and the sample remained in an irreversible phase. This is explained in terms of structural changes at high temperatures. The mobility behaviour of the β phase annealed thin films is illustrated. We use the Petritz barrier model to explain the activation energy of the mobility as due to the grain boundaries of the polycrystallites. The optical properties (refractive index and absorption coefficient) are also reported. The direct band gaps of In2Se3 thin films are 1.43 eV and 1.55 eV for the α phase and β phase respectively. These values are obtained from transmission measurements and are confirmed through photoconductivity measurements.
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