可靠性工程
小型化
可靠性(半导体)
计算机科学
电气工程
工程类
量子力学
物理
功率(物理)
作者
Pan Wang,Huarui Xu,Guisheng Zhu,Yunyun Zhao,Jinjin Li,Aibing Yu
标识
DOI:10.1007/s10854-016-6029-5
摘要
In this paper, a method of preparing ultra-compact MLCC is introduced. The BaTiO3 dielectric layers were prepared by sol–gel technology and the Ag electrode layers were achieved via magnetron sputtering technology. The method of laser etching was adopted to achieve the pattern of electrode layer instead of stencil printing and photoetching and a special sintering process was used to make the ideal thickness and effectively prevent delamination. Through the above method, MLCCs with the monolayer thickness less than 200 nm and the dimensional accuracy below 0.1 μm have been able to successfully make. And by testing the relationship between capacitance and loss with temperature and frequency, the reliability of the simple sample had been proved preliminarily. The study offers a new method for the preparation of miniaturizing MLCCs, which is more effective and lower costs.
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