逐次逼近ADC
压控振荡器
噪声整形
电容器
比较器
有效位数
积分器
电子工程
计算机科学
相位噪声
带宽(计算)
宽带
噪音(视频)
环形振荡器
塑造
物理
电压
电气工程
工程类
CMOS芯片
电信
人工智能
图像(数学)
作者
Sanjeev Tannirkulam Chandrasekaran,Sumukh Prashant Bhanushali,Stefano Pietri,Arindam Sanyal
出处
期刊:IEEE Journal of Solid-state Circuits
[Institute of Electrical and Electronics Engineers]
日期:2021-11-30
卷期号:57 (4): 1100-1111
被引量:4
标识
DOI:10.1109/jssc.2021.3128489
摘要
We present an OTA-free 1–1 multi-stage noise-shaping (MASH) analog-to-digital converter (ADC) utilizing a fully passive noise-shaping successive approximation register (NS-SAR) as the first stage and an open-loop ring voltage-controlled oscillator (VCO) as the second stage. The key contribution of this work is to address the challenge of driving large sampling capacitors for high-resolution NS-SAR. The proposed architecture allows a low-resolution NS-SAR stage and leverages residue attenuation due to passive charge sharing in the NS-SAR to linearize the VCO. The MASH architecture suppresses quantization noise and SAR comparator noise at the ADC output, and the high pass shapes VCO thermal noise. In addition, we demonstrate a computationally inexpensive foreground inter-stage gain calibration algorithm for the proposed ADC architecture. The prototype ADC consumes 0.16 mW while achieving an SNDR/DR of 71.5/75.8 dB over a 1.1-MHz bandwidth and Walden FoM of 23.3 fJ/step, which is the lowest in 65-nm technology.
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