催化作用
材料科学
扫描透射电子显微镜
碳纤维
电子能量损失谱
表征(材料科学)
金属
氮气
纳米技术
分析化学(期刊)
无机化学
透射电子显微镜
化学
有机化学
冶金
复合材料
复合数
作者
David M. Koshy,Alan Landers,David A. Cullen,Anton V. Ievlev,Harry M. Meyer,Christopher Hahn,Zhenan Bao,Thomas F. Jaramillo
标识
DOI:10.1002/aenm.202001836
摘要
Abstract Metal, nitrogen‐doped carbon materials have attracted interest as heterogenous catalysts that contain MN x active sites that are analogous to molecular catalysts. Of particular interest is Ni,N‐doped carbon, a catalyst that is active for the electrochemical reduction of CO 2 to CO. Critical to the understanding of these materials is proof of single atomic sites and characterization of the environment surrounding the metal atom; however, directly probing this coordination remains challenging. This challenge is addressed by combining scanning transmission electron microscopy (STEM), single atom electron energy loss spectroscopy (EELS), and time‐of‐flight secondary ion mass spectrometry (ToF‐SIMS). Through STEM imaging, atomic dispersion of Ni in the carbon framework is confirmed and image analyses are utilized to give semiquantitative estimates of neighbor distance distributions and site densities of Ni atoms. Atomic resolution EELS demonstrates that N and Ni are colocated at the single Ni atom sites suggesting Ni–N coordination. ToF‐SIMS reveals a distribution of NiN x C y − fragments that reflect the Ni–N bonding environments within Ni,N‐doped carbon. The fragmentation from Ni,N‐doped carbon is similar to Ni phthalocyanine, suggesting the existence of heterogenized, molecular‐like NiN 4 active sites which motivates future studies that leverage insight from molecular catalysis design to develop next‐generation heterogeneous catalysts.
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