High-speed (subsecond) measurement of heat capacity, electrical resistivity, and thermal radiation properties of tantalum in the range 1900 to 3200 K

ta nt a lum a bove 1900 K by a pul se hea tin g tec hniqu e are d esc ri bed.Dura ti o n o f' an individual ex pt'rim e nt , in whieh th e s pec im e n is he at ed f'rom room te mpe ra ture to nea r it s me ltin g puint , is less th a n u ne second .Tempe rature meas ure me nt s are made wi th a ph()toele c tri c p yrom e te r.Expe rim e nt a l quant iti es are reco rd ed with a digita l data acq ui s iti o n sys tem.Tim e reso luti on 0 1' th e e ntire sys te m is 0.4 m s .Res ult s on th e a bov e p ro pe rti es of' ta nt a lum in th e ran ge 1900 to 3200 K are r(' port ed a nd a re co mpared with those in th e lit e ra ture.Es timat ed in acc uracy of' me a s ure d p rope rti es in th e abov e te mp e ra ture ran ge is 2 tt) 3 pe rce nt 1' 0 1' hea t capac it y, 0.5 pe rce nt fur e lec tri ca l res is tiv it y, 3 pe rce nt fo r he mi s ph er ica l to ta l c m ill ance , and 2 pe rce nt for no rm a l spec tr'a l e millanc e.