MOSFET
掉期(金融)
机制(生物学)
计算机科学
材料科学
电气工程
工程类
业务
晶体管
物理
电压
财务
量子力学
作者
Jun Ye,Weiye Mo,Xuan Xiao,Haonan Liu,Yang Song,Wei Huang,Debin Zhang,David Wei Zhang
标识
DOI:10.1109/ispsd59661.2024.10579571
摘要
Based on the increasing requirements for automotive power devices used in linear mode, which require both wider Safe Operating Area (SOA) performance and lower $R_{ds-on}$, SGT (RARS-SGT) with the Regional Allocate Resistance of Source is firstly developed in this paper. The performance of SOA is increased by 48% with the $\boldsymbol{\max I_{d}}$ raising to $20\mathbf{A}$, while it is 13.5 A for Conventional SGT (C-SGT) in condition of $V_{d}=V_{\mathrm{g}}$= 10 V and $\boldsymbol{PT=10}$ ms. In addition, it solves the problem that $R_{ds-on}$ is inevitably increasing in Channel Dummy SGT (CD-SGT) proposed by us earlier. The test and simulation results show that RARS-SGT has lower ZTC and weaker positive current-temperature feedback, because it sets up the self-ballast negative feedback mechanism to increase the source potential $V_{s}$ and further also suppress the trigger of parasitic NPN.
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