辐照度
光学
光线追踪(物理)
蒙特卡罗方法
计算机科学
镜头(地质)
极限(数学)
几何光学
追踪
物理
数学
统计
操作系统
数学分析
出处
期刊:Optics Letters
[The Optical Society]
日期:2023-02-21
卷期号:48 (7): 1726-1726
被引量:2
摘要
Precise control of irradiance distribution is a complicated problem for freeform lens design, especially when the target is non-uniform. Realistic sources are often simplified as zero-etendue ones in cases designed for content-rich irradiance fields while the surfaces are usually assumed smooth everywhere. These practices can limit the performance of the designs. We developed an efficient proxy for Monte Carlo (MC) ray tracing under extended sources, with the linear property of our triangle mesh (TM) freeform surface. Our designs show finer irradiance control compared to their counterparts from the LightTools design feature. One of the lenses is fabricated and evaluated in an experiment, and performed as expected.
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