电介质
材料科学
氮化硼
半导体
光电子学
纳米技术
范德瓦尔斯力
氮化物
卤化物
六方氮化硼
工程物理
石墨烯
化学
无机化学
物理
分子
图层(电子)
有机化学
作者
William G. Vandenberghe,Mehrdad Rostami Osanloo
出处
期刊:ACS applied electronic materials
[American Chemical Society]
日期:2023-02-15
卷期号:5 (2): 623-631
被引量:14
标识
DOI:10.1021/acsaelm.2c01435
摘要
Recent developments in the field of two-dimensional (2D) van der Waals (vdW) dielectrics have captured great interest because of potential applications of 2D materials in future generations of complementary metal-oxide semiconductor (CMOS) technologies. In this Spotlight article, we highlight the progress we recently made toward the discovery of 2D vdW dielectrics, which will be critical to realizing a vdW transistor technology. We provide an overview of how to calculate the dielectric properties of 2D vdW dielectric candidates from first-principles using density functional theory. Furthermore, we show how to quantify the anticipated leakage current through a 2D vdW dielectric. We illustrate the use of hexagonal boron nitride (h-BN), oxyhalides, transition-metal nitride halides (TMNH), and alkaline hydroxides.
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