钻石
材料科学
空位缺陷
光致变色
光致发光
硅
光电子学
化学物理
荧光
纳米尺度
纳米技术
光化学
化学
光学
结晶学
物理
复合材料
作者
A. A. Wood,Artur Lozovoi,Zi-Huai Zhang,Sachin Sharma,Gabriel I. López-Morales,Harishankar Jayakumar,Nathalie P. de Leon,Carlos A. Meriles
出处
期刊:Nano Letters
[American Chemical Society]
日期:2023-01-20
卷期号:23 (3): 1017-1022
被引量:7
标识
DOI:10.1021/acs.nanolett.2c04514
摘要
The silicon vacancy (SiV) center in diamond is typically found in three stable charge states, SiV0, SiV-, and SiV2-, but studying the processes leading to their formation is challenging, especially at room temperature, due to their starkly different photoluminescence rates. Here, we use confocal fluorescence microscopy to activate and probe charge interconversion between all three charge states under ambient conditions. In particular, we witness the formation of SiV0 via the two-step capture of diffusing, photogenerated holes, a process we expose both through direct SiV0 fluorescence measurements at low temperatures and confocal microscopy observations in the presence of externally applied electric fields. In addition, we show that continuous red illumination induces the converse process, first transforming SiV0 into SiV- and then into SiV2-. Our results shed light on the charge dynamics of SiV and promise opportunities for nanoscale sensing and quantum information processing.
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