锆钛酸铅
材料科学
铁电性
极化(电化学)
电容器
薄膜
磁滞
不对称
直流偏压
电压
光电子学
电介质
复合材料
凝聚态物理
电气工程
化学
纳米技术
物理
物理化学
量子力学
工程类
作者
G. Poullain,R. Bouregba,Bertrand Vilquin,G. Le Rhun,H. Murray
摘要
Hysteresis measurements performed on graded Pt/lead zirconate titanate (PZT)/Pt structures with well oxygenated PZT films do not display any shift along the polarization axis (Voffset) as previously reported. On the other hand, when the PZT graded films were grown under low oxygen pressure, an offset voltage was measured. This shift was systematically enhanced after cycling the film as for fatigue measurements. It was also observed that the Voffset is independent of the value of the reference capacitor used in the Sawyer–Tower circuit. We propose an asymmetry in the leakage current of the structure to be at the origin of the shift along the polarization axis.
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