ISFET
非晶硅
电压
阈值电压
晶体管
场效应晶体管
电气工程
材料科学
硅
频道(广播)
光电子学
简单(哲学)
电导率
电子工程
工程类
分析化学(期刊)
化学
物理化学
晶体硅
哲学
认识论
色谱法
作者
Yasir Hashim,Othman Sidek
摘要
Abstract A mathematical model for the calculation of the output characteristics of amorphous silicon hydrogenated (a‐Si:H) ion‐sensitive field‐effect transistors (ISFET) is developed, which depends on the integration of the conductivity channel versus gate voltage curve at fixed drain voltage. Single curve integration was changed to integration with many simple lines to obtain the I D − V D characteristics using computer programming. The results of this model were tested with those of experiments. © 2011 Institute of Electrical Engineers of Japan. Published by John Wiley & Sons, Inc.
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