粗糙度(岩土工程)
磨料
材料科学
接触力学
原子力显微镜
复合材料
硅
机械
纳米技术
冶金
热力学
物理
有限元法
作者
Bernd Gotsmann,Mark A. Lantz
标识
DOI:10.1103/physrevlett.101.125501
摘要
Abrasive wear of sharp silicon tips sliding distances of up to 750 m on a polymeric surface is studied using atomic force microscopy. The data cannot be explained by conventional macroscopic wear models. We present a new model in which the barrier for breaking an atomic bond is lowered by the frictional stress acting on the contact. Quantitative agreement is obtained between the model and wear data for all load forces and sliding distances studied.
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