铁电性
材料科学
机制(生物学)
原子单位
光电子学
比例(比率)
纳米技术
复合材料
电介质
量子力学
物理
作者
Yihao Yang,Ming Wu,Xingwen Zheng,Chunyan Zheng,Jibo Xu,Zhiyu Xu,Xiaofei Li,Xiaojie Lou,Di Wu,Xiaohui Liu,Stephen J. Pennycook,Zheng Wen
出处
期刊:Science Advances
[American Association for the Advancement of Science (AAAS)]
日期:2021-11-24
卷期号:7 (48): eabh2716-eabh2716
被引量:52
标识
DOI:10.1126/sciadv.abh2716
摘要
Role of charged defects in resistance fatigue of ferroelectric tunnel junctions has been revealed at atomic scale.
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