二硒化钨
光致发光
拉曼光谱
材料科学
二硫化钼
二硫化钨
半导体
单层
二硒醚
带隙
钼
过渡金属
光电子学
光谱学
钨
光学
分析化学(期刊)
纳米技术
化学
物理
硒
催化作用
冶金
量子力学
生物化学
色谱法
作者
Philipp Tonndorf,Robert Schmidt,Philipp Böttger,Xiao Zhang,Janna Börner,A. Liebig,M. Albrecht,Christian Kloc,Ovidiu D. Gordan,Dietrich R. T. Zahn,Steffen Michaelis de Vasconcellos,Rudolf Bratschitsch
出处
期刊:Optics Express
[The Optical Society]
日期:2013-02-20
卷期号:21 (4): 4908-4908
被引量:1350
摘要
We mechanically exfoliate mono- and few-layers of the transition metal dichalcogenides molybdenum disulfide, molybdenum diselenide, and tungsten diselenide. The exact number of layers is unambiguously determined by atomic force microscopy and high-resolution Raman spectroscopy. Strong photoluminescence emission is caused by the transition from an indirect band gap semiconductor of bulk material to a direct band gap semiconductor in atomically thin form.
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