等离子体增强化学气相沉积
钝化
材料科学
薄脆饼
非晶硅
单晶硅
太阳能电池
晶体硅
光电子学
硅
开路电压
图层(电子)
纳米技术
电压
电气工程
工程类
作者
Xiaoning Ru,Minghao Qu,Jianqiang Wang,Tianyu Ruan,Miao Yang,Fuguo Peng,Wei Long,Kun Zheng,Hui Yan,Xixiang Xu
标识
DOI:10.1016/j.solmat.2020.110643
摘要
Here we report a certified efficiency of up to 25.11% for silicon heterojunction (SHJ) solar cells on a full size n-type M2 monocrystalline-silicon (c-Si) wafer (total area, 244.5 cm2). An ultra-thin intrinsic a-Si:H buffer layer was introduced on the c-Si wafer surface using a 13.56 MHz home-made RF-PECVD with low deposition rate showing superior surface passivation. The ultra-thin i-a-Si:H film with both higher microstructure factor (R*) and H content evidently increases the SHJ solar cell open-circuit voltage (VOC) by 2 mV, and moreover, short-circuit current (ISC) and fill factor (FF) are also notably improved, resulting in a 0.52% absolute cell efficiency enhancement, in which FF is the main cause. In order to explore high conversion efficiency SHJ solar cells, both home-made RF-PECVD and commercial VHF-PECVD (40.68 MHz) are employed for deposition of the i-a-Si:H passivation layer. As a result, the efficiency of RF-PECVD-prepared SHJ cell is 0.21% higher than that of VHF-PECVD-prepared, mainly driven by VOC and ISC boost. This work offers a useful tool for fabrication of high performance SHJ solar cells which could be employed in mass production.
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