DNA损伤
DNA
电离辐射
可视化
原子力显微镜
体内
辐射损伤
显微镜
生物物理学
材料科学
辐照
生物
放射化学
化学
纳米技术
遗传学
光学
计算机科学
数据挖掘
物理
生物化学
核物理学
作者
Toshiaki Nakano,Ken Akamatsu,Masataka Tsuda,Ayane Tujimoto,Ryoichi Hirayama,Takeshi Hiromoto,Taro Tamada,Hiroshi Ide,Naoya Shikazono
标识
DOI:10.1073/pnas.2119132119
摘要
SignificanceDNA damage causes loss of or alterations in genetic information, resulting in cell death or mutations. Ionizing radiations produce local, multiple DNA damage sites called clustered DNA damage. In this study, a complete protocol was established to analyze the damage complexity of clustered DNA damage, wherein damage-containing genomic DNA fragments were selectively concentrated via pulldown, and clustered DNA damage was visualized by atomic force microscopy. It was found that X-rays and Fe ion beams caused clustered DNA damage. Fe ion beams also produced clustered DNA damage with high complexity. Fe ion beam-induced complex DNA double-strand breaks (DSBs) containing one or more base lesion(s) near the DSB end were refractory to repair, implying their lethal effects.
科研通智能强力驱动
Strongly Powered by AbleSci AI