水冷
功率半导体器件
热阻
半导体器件
MOSFET
热的
功率(物理)
半导体
被动冷却
过程(计算)
计算机科学
机械工程
电子工程
工程类
电气工程
材料科学
晶体管
电压
物理
纳米技术
热力学
操作系统
图层(电子)
作者
Krzysztof Górecki,K. Posobkiewicz
出处
期刊:Energies
[MDPI AG]
日期:2022-06-22
卷期号:15 (13): 4566-4566
被引量:5
摘要
In this paper, a detailed review of contemporary cooling systems of semiconductor devices is presented. The construction and the principles of operation of selected components of passive and active cooling systems, as well as selected computer tools supporting the design of such systems, are described. The dependences of thermal parameters calculated using these tools on selected factors characterizing the used cooling systems, e.g., the dimensions of their components, are presented and discussed. Additionally, some results of measurements illustrating the influence of selected parameters on the thermal resistance of power MOSFETs mounted in different cooling systems are shown. The properties of selected cooling systems are compared, and it is shown that by changing the type of cooling system, it is possible to reduce the thermal resistance value of a power MOSFET even 20 times. The presented considerations can make the process of designing cooling systems more effective.
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