材料科学
晶体管
光电子学
兴奋剂
电子迁移率
半导体
逆变器
电子线路
与非门
数码产品
纳米技术
薄膜晶体管
氧化物
逻辑门
电气工程
电压
图层(电子)
冶金
工程类
作者
Ruohao Hong,Penghui He,Sen Zhang,Xitong Hong,Qianlei Tian,Chang Liu,Tong Bu,Wanhan Su,Guoli Li,Denis Flandre,Xingqiang Liu,Yawei Lv,Lei Liao,Xuming Zou
出处
期刊:Nano Letters
[American Chemical Society]
日期:2024-01-19
卷期号:24 (4): 1176-1183
标识
DOI:10.1021/acs.nanolett.3c03953
摘要
Metal oxide semiconductor (MOS)-based complementary thin-film transistor (TFT) circuits have broad application prospects in large-scale flexible electronics. To simplify circuit design and increase integration density, basic complementary circuits require both p- and n-channel transistors based on an individual semiconductor. However, until now, no MOSs that can simultaneously show p- and n-type conduction behavior have been reported. Herein, we demonstrate for the first time that Cu-doped SnO (Cu:SnO) with HfO2 capping can be employed for high-performance p- and n-channel TFTs. The interstitial Cu+ can induce an n-doping effect while restraining electron–electron scatterings by removing conduction band minimum degeneracy. As a result, the Cu3 atom %:SnO TFTs exhibit a record high electron mobility of 43.8 cm2 V–1 s–1. Meanwhile, the p-channel devices show an ultrahigh hole mobility of 2.4 cm2 V–1 s–1. Flexible complementary logics are then established, including an inverter, NAND gates, and NOR gates. Impressively, the inverter exhibits an ultrahigh gain of 302.4 and excellent operational stability and bending reliability.
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