Transfer of III-nitride epitaxial layers onto pre-patterned silicon substrates for the simple fabrication of free-standing MEMS

制作 材料科学 微电子机械系统 薄脆饼 氮化硅 外延 基质(水族馆) 氮化物 光电子学 范德瓦尔斯力 谐振器 半导体 蚀刻(微加工) 纳米技术 图层(电子) 化学 地质学 分子 有机化学 海洋学 病理 替代医学 医学
作者
Rajat Gujrati,Arafa Kassem,Cédric Ayela,Fabrice Mathieu,Liviu Nicu,Suresh Sundaram,Isabelle Dufour,William D. Hunt,A. Ougazzaden,Jean‐Paul Salvestrini,Thierry Leïchlé
出处
期刊:Applied Physics Letters [American Institute of Physics]
卷期号:124 (10)
标识
DOI:10.1063/5.0191772
摘要

In recent years, the remarkable properties and potential applications of III-nitride (III-N) semiconductors have sparked a significant interest in the field of microelectromechanical systems (MEMS). Traditionally, III-N MEMS are fabricated through a process involving the epitaxial growth of III-N epilayers on a silicon substrate followed by etching the handle wafer to generate free-standing structures. In this study, we explore the potential of a relatively simple approach based on the two-dimensional (2D) material-based liftoff and transfer to fabricate III-N mechanical resonators. The methodology involves van der Waals epitaxy of III-N layers on 2D hexagonal-boron nitride (h-BN), which leverages the weak van der Waals adhesion between h-BN layers to lift off and transfer these layers from their original growth substrate to an alternative host substrate. The employed method is demonstrated by fabricating 600 nm thick GaN/AlGaN and 2.5 μm thick h-BN micro-resonators onto pre-patterned cavities etched in silicon substrates. These devices are characterized using laser Doppler vibrometry, enabling the observation of well-defined modes of vibration and resonant frequencies. Furthermore, finite element method simulations are performed to gain insights into the experimental observations and the mechanical properties of the transferred layers. This approach could be extended to transfer high-quality III-N MEMS devices onto various host substrates, including flexible substrates, and could be used to assess the mechanical properties of emerging III-N semiconductor materials.
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