Evolution of in-plane strain fields onset of a plastically deforming crack in zirconium

微尺度化学 材料科学 数字图像相关 吕德斯乐队 打滑(空气动力学) 电子背散射衍射 可塑性 有限元法 各向同性 等距 平面应力 滑移线场 机械 剪切(地质) 复合材料 几何学 结构工程 微观结构 光学 热力学 数学教育 工程类 物理 数学
作者
Rabindra Roy,Matthew Topping,Mark R. Daymond
出处
期刊:Acta Materialia [Elsevier BV]
卷期号:263: 119525-119525 被引量:1
标识
DOI:10.1016/j.actamat.2023.119525
摘要

Understanding the fracture behaviour of a material is essential for the sustainable design of structural components. The complex nature of microscale mechanical testing techniques makes identifying the fracture behaviour experimentally challenging at a microscopic scale. Validating microscale simulations with experimental studies can be challenging using traditional experimental techniques. High-resolution digital image correlation combined with electron backscatter diffraction describes the total in-plane deformation field at a microstructural scale, which can be compared against finite element models for verification. The present study determines the in-plane strain distribution ahead of a plastically deforming crack during an in-situ experiment. A crystal plasticity-based finite element model is used to simulate the experimental crack tip behaviour, after which quantitative and qualitative comparisons are made. A concentration of normal strains ahead of the crack tip is observed in both experimental and simulated results, defining the fracture process zone. Slip localization behaviour around the crack is also evaluated using Schmid factor analysis. A good correlation between the experimental slip bands and theoretical predictions has been observed. The strain path dependence on slip activation is also identified. Strain localization in the deforming zirconium is initially limited with dense and low-intensity slip occurring up to a maximum in-plan shear strain of 0.2. Formation of well-defined equidistant slip bands occurs with further deformation. Equidistant slip bands are observed for prismatic and pyramidal slip systems, having an interplane distance of ∼0.60±0.05 µm and ∼0.46±0.04 µm, respectively.

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