光探测
纳米光子学
光电探测器
光电子学
圆极化
极化(电化学)
光学
纳米线
雷
物理
生物光子学
平面的
波长
探测器
激发
材料科学
光子学
微带线
化学
计算机图形学(图像)
物理化学
量子力学
计算机科学
作者
Jiho Hong,Jorik van de Groep,Nayeun Lee,Soo Jin Kim,Philippe Lalanne,Pieter G. Kik,Mark L. Brongersma
出处
期刊:Optica
[The Optical Society]
日期:2022-11-21
卷期号:10 (1): 134-134
被引量:20
标识
DOI:10.1364/optica.468252
摘要
Modern-day sensing and imaging applications increasingly rely on accurate measurements of the primary physical quantities associated with light waves: intensity, wavelength, directionality, and polarization. These are conventionally performed with a series of bulky optical elements, but recently, it has been recognized that optical resonances in nanostructures can be engineered to achieve selective photodetection of light waves with a specific set of predetermined properties. Here, we theoretically illustrate how a thin silicon layer can be patterned into a dislocated nanowire-array that affords detection of circularly polarized light with an efficiency that reaches the theoretical limit for circular dichroism of a planar detector in a symmetric external environment. The presence of a periodic arrangement of dislocations is essential in achieving such unparalleled performance as they enable selective excitation of nonlocal, guided-mode resonances for one handedness of light. We also experimentally demonstrate compact, high-performance chiral photodetectors created from these dislocated nanowire-arrays. This work highlights the critical role defects can play in enabling new nanophotonic functions and devices.
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