材料科学
可靠性(半导体)
残余应力
流离失所(心理学)
压力(语言学)
瞬态(计算机编程)
残余物
发光二极管
过程(计算)
光电子学
机械工程
复合材料
计算机科学
工程类
心理学
功率(物理)
语言学
物理
哲学
算法
量子力学
心理治疗师
操作系统
作者
Jinwen Pan,Haojie Zhou,Xiaoxiao Ji,Liang Chen,Luqiao Yin,Jianhua Zhang
标识
DOI:10.1109/sslchinaifws60785.2023.10399648
摘要
Micro LED display technology is considered to be the next generation of display technology and finds widespread applications in displays and visible light communication. Key cooperation plays a crucial role in achieving electrical interconnections for Micro LED, which significantly impact their luminous quality and reliability. This study aims to analyze the stress-strain evolution during the bonding process of Micro LED arrays with cylindrical and spherical In bumps using COMSOL. The results demonstrate that the displacement of the bumps after bonding decreases by up to 97% compared to the displacement observed during the temperature-holding phase. Furthermore, the stresses during the temperature rise and fall stages approximately exhibit a linear relationship with temperature, and residual stresses exist after bonding. Additionally, residual stresses remain present after bonding. This study provides theoretical guidance for optimizing the bonding process of Micro LED and further exploration for the commercialization of Micro LED.
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