NMOS逻辑
PMOS逻辑
计算机科学
电子工程
纳米片
逻辑门
频率标度
功率(物理)
纳米电子学
静态随机存取存储器
逻辑综合
晶体管
缩放比例
光电子学
材料科学
电气工程
物理
工程类
纳米技术
电压
数学
量子力学
几何学
作者
Pieter Weckx,Julien Ryckaert,E. Dentoni Litta,Dmitry Yakimets,P. Matagne,P. Schuddinck,Doyoung Jang,Bilal Chehab,Rogier Baert,Mohit Gupta,Yusuke Oniki,L.-Å. Ragnarsson,Naoto Horiguchi,A. Spessot,Diederik Verkest
出处
期刊:International Electron Devices Meeting
日期:2019-12-01
被引量:55
标识
DOI:10.1109/iedm19573.2019.8993635
摘要
To compensate for expected gate pitch scaling slowdown below 42nm, several scaling boosters are needed to reduce the logic standard cell height (CH). However, limited scaling benefits can be achieved using FinFET and Gate all around (GAA) nanosheets (NSHs) due integration limits in achieving tight PMOS to NMOS (PN) separation. Therefore, a novel forksheet (FSH) device architecture is proposed achieving extremely scaled PN space using limited additional processing complexity. The FSH achieves 10% frequency increase at iso-power and 24% power reduction at iso-frequency compared to GAA nanosheet with a combined area scaling of 20%. SRAM bit cell area scaling of 30% and read delay performance increase is shown.
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