母线
底纹
钝化
材料科学
光电子学
晶体硅
太阳能电池
光学
电气工程
硅太阳电池
计算机科学
工程类
物理
复合材料
图层(电子)
计算机图形学(图像)
作者
Martin Hermle,Filip Granek,Oliver Schultz‐Wittmann,Stefan W. Glunz
出处
期刊:Photovoltaic Specialists Conference
日期:2008-05-01
被引量:65
标识
DOI:10.1109/pvsc.2008.4922761
摘要
One of the most often mentioned advantages of back-junction back-contacted silicon solar cells is that this cell structure has no shading losses, because metallization fingers and busbars are both located on the rear side of the solar cell. However, this is only true if only optical shading losses are regarded. In this work electrical shading losses due to recombination in the region of base busbar and fingers are analyzed using two-dimensional numerical device and network simulations. The base doping dependence of these effects is investigated as well as the influence of the rear side passivation. The results of the simulations are compared with EQE maps of back-junction solar cells. The influence of the busbars is quantified and the influence on the overall cell performance is discussed.
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