铌
电子能量损失谱
价(化学)
氧化铌
材料科学
氧化物
密度泛函理论
光谱学
透射电子显微镜
氧化态
金属
凝聚态物理
化学物理
分析化学(期刊)
化学
纳米技术
计算化学
冶金
物理
有机化学
量子力学
色谱法
作者
Runzhe Tao,Ružica Todorović,Jingjing Liu,Randall J. Meyer,Andrew Arnold,Weronika Walkosz,Peter Zapol,Alexander Romanenko,L. D. Cooley,Robert F. Klie
摘要
We present a series of electron energy-loss spectroscopy (EELS) studies on niobium (Nb) and its oxides (NbO, NbO2, and Nb2O5) to develop a reliable method for quantifying the oxidation state in mixed niobium oxide thin films. Our approach utilizes a combination of transmission electron microscopy and EELS experiments with density functional theory calculations to distinguish between metallic niobium and the different niobium oxides. More specifically, the differences in the near-edge fine-structure of the Nb M-edge and O K-edge provide sufficient information to determine the valence state of niobium. Based on these observed changes in the core-loss edges, we propose a linear relationship that correlates the peak positions in the Nb M- and O K-edges with the Nb valence state. The methods developed in this paper are also applied to ultrathin niobium oxide films to examine the effects of low-temperature baking on the films’ oxidation states.
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