X射线光电子能谱
薄膜
无定形固体
光解
退火(玻璃)
材料科学
光化学
化学计量学
光谱学
辐照
化学
化学工程
结晶学
纳米技术
物理化学
冶金
量子力学
物理
工程类
核物理学
作者
G. Cabello,Luis Lillo,G.E. Buono-Core
标识
DOI:10.1016/j.jnoncrysol.2007.08.014
摘要
In this paper amorphous ZrO2 and HfO2 thin films were obtained by direct UV irradiation of Zr(IV) and Hf(IV) β-diketonate precursor complexes on Si(1 0 0) and fused silica substrates. The precursors, Zr(CH3COCHCOCH3)4 and Hf(C6H5COCHCOCH3)4 were deposited as amorphous thin films by spin coating. The photochemistry of these films was monitored by FT-IR spectroscopy. The photolysis with 254 nm light led to the loss of the ligands from the coordination complexes, and the production of metallic oxides. The thin films products were characterized by X-ray photoelectron spectroscopy (XPS) and atomic force microscopy (AFM). These analyses revealed that as-deposited films are amorphous and that the presence of carbon is thought to arise from the ligands. However, post-annealing of the photodeposited films favors the stoichiometric and optical properties of ZrO2 and HfO2 thin films.
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