重定目标
计算机科学
布线(电子设计自动化)
路由器
过程(计算)
方案(数学)
集成电路布局
页面布局
平面布置图
平版印刷术
忠诚
模拟电子学
电子线路
计算机工程
电子工程
集成电路
嵌入式系统
人工智能
计算机网络
电气工程
工程类
电信
数学分析
艺术
业务
视觉艺术
广告
操作系统
数学
作者
Mohammad Torabi,Lihong Zhang
出处
期刊:ACM Transactions on Design Automation of Electronic Systems
[Association for Computing Machinery]
日期:2020-08-12
卷期号:25 (6): 1-22
摘要
Performance degradation in analog circuits due to layout dependent effects (LDEs) has become increasingly challenging in advanced technologies. To address this issue, LDEs have to be seriously considered as performance constraints in the physical design process. In this article, we have proposed an innovative LDE-aware retargeting methodology for analog layout migration from old technologies to new ones with LDEs optimized for performance preservation. The LDE constraints, which are first identified with the aid of a specialized sensitivity analysis scheme, are satisfied during the layout migration process. Moreover, optical proximity correction (OPC), as one of the most popular resolution enhancement techniques for subwavelength lithography in modern nanometer technology manufacturing, is also included in this study. We have developed an OPC-inclusive ILP-based analog router to route electrical nets for improving image fidelity of the final layout while the routability and other analog constraints are respected in the meantime. The experimental results show our proposed layout migration methodology along with the routing scheme is able to retarget analog layouts with better circuit performance and finer image quality compared to the previous works.
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